| |
 |
|
|
Science Forum Index » Nanotechnology Forum » drift correction
Page 1 of 1
|
| Author |
Message |
| Rostislav Lapshin |
 Posted: Sat Feb 17, 2007 11:16 am |
|
|
|
Guest
|
Dear Colleagues,
When measuring topography and surface properties with probe
instruments in nanometer scale at room temperature, drift of the probe
relative to the sample surface is an important issue of the
measurements precision. I would like those interested in the problem
to pay attention to a simple but effective method based on counter-
scanning. Being used together with topography feature recognition, the
method is fully automatic. If no suitable recognition software is
available, the method may be used as semiautomatic. The method may be
applied to any device that has a probe (mechanical tip, focused light
beam, focused electron beam, focused ion beam, etc.), a scanning
system (scanner) and a unit that registers results of probe
interaction with the measured surface.
The method suggested is easy to embed in feature-oriented scanning
(FOS). FOS is considered as a perspective approach to implement bottom-
up nanofabrication since it is able during modification/stimulation/
manipulation operation to keep a surface feature in the "field of
view" of the instrument.
Detailed description of the method is to be found in my paper
"Automatic drift elimination in probe microscope images based on
techniques of counter-scanning and topography feature recognition"
recently published in Measurement Science and Technology (vol. 18,
iss. 3, pp. 907-927, 2007). So far the paper is freely available at
http://stacks.iop.org/MST/18/907.
Thank you for your attention.
Best regards,
Rostislav V. Lapshin
Rostislav V. Lapshin, Ph. D.
Staff Scientist
Solid Nanotechnology Laboratory
Institute of Physical Problems
Zelenograd, Moscow, 124460
Russian Federation
tel: +7 (495) 536-9379
fax: +7 (495) 531-5592
pri email: rlapshin@yahoo.com
sec email: rlapshin@gmail.com
web: http://www.nanoworld.org/homepages/lapshin/ |
|
|
| Back to top |
|
| |
|
Page 1 of 1
All times are GMT - 5 Hours
The time now is Sat Oct 11, 2008 12:51 am
|
|